White light interferometer for reliable thickness measurement with submicron accuracy
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The new IMS5200-TH white light interferometer opens up new possibilities for fast and reliable thickness measurements. The controller features intelligent evaluation and enables precise thickness measurement of transparent layers as thin as 1 µm. Their high measuring rate up to 24 kHz makes the IMS5200 models ideal for industrial use. Nanometer accuracy for layers as thin as 1 µm. | |||
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